| DOC TYPE |
VIEW CITATION |
|
STD |
American National Standard guide
for electrostatic discharge test methodologies and criteria for
ele ANSI/IEEE Std C63.16-1993 , Page(s): i |
|
PER |
Simulation of electrical
overstress thermal failures in integrated circuits
Diaz, C.H.; Sung-Mo Kang; Duvvury, C. Electron Devices, IEEE Transactions on Volume: 41 3 , Page(s): 359 -366 |
|
PER |
Analysis of soft breakdown failure with ESD on output buffer nMOSFETs and its improvement Kurachi, I.; Fukuda, Y.; Miura, N.; Ichikawa, F. Industry Applications, IEEE Transactions on Volume: 30 2 , Page(s): 358 -364 |
|
PER |
Concept of a modular grid to
control ESD in electronic systems Greason, W.D. Industry Applications, IEEE Transactions on Volume: 30 5 , Page(s): 1425 -1436 |
|
PER |
Environmental stability of low
absorptivity optical solar reflectors and their impact on spacecraft
charging Bogorad, A.; Herschitz, R.; Bowman, C. Nuclear Science, IEEE Transactions on Volume: 41 6 1 , Page(s): 2400 -2403 |
|
PER |
Fast electrostatic discharges
between a charged thin dielectric film and a spherical electrode with or
without dielectric coating Oda, T.; Sakai, Y. Industry Applications, IEEE Transactions on Volume: 30 3 , Page(s): 595 -601 |
|
PER |
Analysis of human body model for
electrostatic discharge (ESD) with multiple charged
sources Greason, W.D. Industry Applications, IEEE Transactions on Volume: 30 3 , Page(s): 589 -594 |
|
PER |
Circuit-level electrothermal
simulation of electrical overstress failures in advanced MOS I/O
protection devices Diaz, C.H.; Sung-Mo Kang; Duvvury, C. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Volume: 13 4 , Page(s): 482 -493 |
|
PER |
Performance of thin-film chip
resistors Bos, L. Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on [see also Components, Hybrids, and Manufacturing Technology, IEEE Transactions on] Volume: 17 3 , Page(s): 359 -365 |
|
PER |
Technology design for high current
and ESD robustness in a deep submicron CMOS
process Amerasekera, A.; Chapman, R.A. IEEE Electron Device Letters Volume: 15 10 , Page(s): 383 -385 |
|
PER |
1/f noise and radiation effects in
MOS devices Fleetwood, D.M.; Meisenheimer, T.L.; Scofield, J.H. Electron Devices, IEEE Transactions on Volume: 41 11 , Page(s): 1953 -1964 |
|
PER |
A study on the effect of the gate
contact geometry and dimensions on ESD failure threshold level of power
MOSFET's Throngnumchai, K. Electron Devices, IEEE Transactions on Volume: 41 7 , Page(s): 1282 -1287 |
|
PER |
The measurement of solar array
discharges in a simulated space environment
Mulholland, J.E.; Dunn, T.S. Electromagnetic Compatibility, IEEE Transactions on Volume: 36 2 , Page(s): 97 -103 |
|
PER |
Field penetration into metallic
enclosures through slots excited by ESD
Cerri, G.; de Leo, R.; Primiani, V.M.; Righetti, M. Electromagnetic Compatibility, IEEE Transactions on Volume: 36 2 , Page(s): 110 -116 |
|
CNF |
Analysis of models for
electrostatic discharge (ESD) and semiconductor
devices Greason, W.D. Industry Applications Society Annual Meeting, 1994., Conference Record of the 1994 IEEE , Page(s): 1627 -1633 vol.3 |
|
CNF |
Charge and potential control of
electrostatic discharge (ESD) and the human body
Greason, W.D. Industry Applications Society Annual Meeting, 1994., Conference Record of the 1994 IEEE , Page(s): 1493 -1501 vol.2 |
|
CNF |
Investigations of industrial
electrostatic hazards performed by Wolfson
Electrostatics Jones, R. Industry Applications Society Annual Meeting, 1994., Conference Record of the 1994 IEEE , Page(s): 1491 -1492 vol.2 |
|
CNF |
Floated backing electrode effects
on peeling electrostatic discharge between a charged dielectric film and a
metal thin film Oda, T.; Takahashi, T. Industry Applications Society Annual Meeting, 1994., Conference Record of the 1994 IEEE , Page(s): 1406 -1413 vol.2 |
|
CNF |
ESD source modeling in
FDTD Rizvi, M.; Lo Vetri, J. Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on , Page(s): 77 -82 |
|
CNF |
Finite element time domain
simulation of electrostatic discharge using mixed-dimensional finite
elements Brown, B.S.; Rauth, L.L. Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on , Page(s): 95 -98 |
|
CNF |
A nonlinear analytical procedure
for electromagnetic transients in ferromagnetic
shields Croisant, W.J.; Feickert, C.A.; McInerney, M.K. Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on , Page(s): 190 -195 |
|
CNF |
Phenomenological approach for ESD
immunity design Rhoades, W.T. Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on , Page(s): 209 -214 |
|
CNF |
Methodology used for the
development of an electrostatic discharge (ESD) sensitivity classification
for packaging and handling of automotive
components Katrak, K.K. Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on , Page(s): 252 -257 |
|
CNF |
Stable time domain solutions for
EMC problems using PEEC circuit models
Ruehli, A.; Miekkala, U.; Bellen, A.; Heeb, H. Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on , Page(s): 371 -376 |
|
CNF |
Proceedings of 1994 IEEE
International Reliability Physics Symposium
Reliability Physics Symposium, 1994. 32nd Annual Proceedings., IEEE International |
|
CNF |
Photon emission study of ESD
protection devices under second breakdown
conditions Ishizuka, H.; Okuyama, K.; Kubota, K. Reliability Physics Symposium, 1994. 32nd Annual Proceedings., IEEE International , Page(s): 286 -291 |
|
CNF |
Comparison of ESD protection
capability of SOI and bulk CMOS output buffers
Mansun Chan; Yuen, S.S.; Zhi-Jian Ma; Hui, K.Y.; Ko, P.K.; Chenming Hu Reliability Physics Symposium, 1994. 32nd Annual Proceedings., IEEE International , Page(s): 292 -298 |
|
CNF |
Assessment of electro-static
discharge robustness based on the monitoring of lattice temperature of
silicon Yoo, K.D.; Lim, G.H.; Jin, J.H.; Choi, K.H. Microelectronic Test Structures, 1994. ICMTS 1994. Proceedings of the 1994 International Conference on , Page(s): 208 -213 |
|
CNF |
An electrothermal circuit
simulation using an equivalent thermal network for electrostatic discharge
(ESD) Kurimoto, K.; Yamashita, K.; Miyanaga, I.; Hori, A.; Odanaka, S. VLSI Technology, 1994. Digest of Technical Papers. 1994 Symposium on , Page(s): 127 -128 |
|
CNF |
A cost effective approach to
intelligent battery packs Dias, D. WESCON/94. Idea/Microelectronics. Conference Record , Page(s): 321 -323 |
|
CNF |
The effects of clamping diodes on
signal integrity Muranyi, A. WESCON/94. Idea/Microelectronics. Conference Record , Page(s): 476 -481 |
|
CNF |
Water soluble electrically
conducting polymers Angelopoulos, M.; Patel, N.; Shaw, J.M. Electronics and the Environment, 1994. ISEE 1994., Proceedings., 1994 IEEE International Symposium on , Page(s): 66 |
|
CNF |
A study of design/process
dependence of 0.25 /spl mu/m gate length CMOS
Rodder, M.; Amerasekera, A.; Aur, S.; Chen, I.C. Electron Devices Meeting, 1994. Technical Digest., International , Page(s): 71 -74 |
|
CNF |
Mixed-voltage interface ESD
protection circuits for advanced microprocessors in shallow trench and
LOCOS isolation CMOS technologies Voldman, S.H.; Gerosa, G. Electron Devices Meeting, 1994. Technical Digest., International , Page(s): 277 -280 |
|
CNF |
Device integration for ESD
robustness of high voltage power MOSFETs
Duvvury, C.; Rodriguez, J.; Jones, C.; Smayling, M. Electron Devices Meeting, 1994. Technical Digest., International , Page(s): 407 -410 |
|
CNF |
Electrothermal behavior of deep
submicron nMOS transistors under high current snapback (ESD/EOS)
conditions Amerasekera, A.; Seitchik, J.A. Electron Devices Meeting, 1994. Technical Digest., International , Page(s): 455 -458 |
|
CNF |
Degradation of I/O devices due to
ESD-induced dislocations Hashimoto, C.; Okuyama, K.; Kubota, K.; Ishizuka, H. Electron Devices Meeting, 1994. Technical Digest., International , Page(s): 459 -462 |
|
CNF |
Silicon on insulator-an emerging
high-leverage technology El-Kareh, B.; Stanley, T.; Chen, B. Electronic Components and Technology Conference, 1994. Proceedings., 44th , Page(s): 224 -233 |
|
CNF |
Shrinkage matched cofireable thick
film resistors for LTCC Vesudevan, S.; Shaikh, A. Electronic Components and Technology Conference, 1994. Proceedings., 44th , Page(s): 612 -616 |
|
CNF |
IC design considerations for the
harsh automotive electrical environment
Laude, D. Custom Integrated Circuits Conference, 1994., Proceedings of the IEEE 1994 , Page(s): 319 -326 |
|
CNF |
Reducing static related defects
and controller problems in semiconductor production automation
equipment Rush, J.; Steinman, A. Advanced Semiconductor Manufacturing Conference and Workshop. 1994 IEEE/SEMI , Page(s): 95 -99 |
|
CNF |
A tutorial and an experimental
demonstration of how ESD is generated and its impact on electronic
devices Issa, M. Southcon/94. Conference Record , Page(s): 305 |
|
CNF |
Whole-chip ESD protection for CMOS
VLSI/ULSI with multiple power pins Ming-Dou Ker; Chung-Yu Wu; Tao Cheng; Wu, M.J.-N.; Yu, T.-L.; Wang, A.C. Integrated Reliability Workshop, 1994. Final Report., 1994 International , Page(s): 124 -128 |
|
CNF |
Teflon bonding of solar cell
assemblies using Pilkington CMZ and CMG coverglasses-now a production
process Kitchen, C.A.; Dollery, A.A.; Mullaney, K.; Bogus, K. Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on Volume: 2 , Page(s): 2058 -2061 vol.2 |
|
CNF |
Space environmental testing of
blue red reflecting coverglasses for gallium arsenide and high efficiency
silicon solar cells Herschitz, R.; Bogorad, A. Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on Volume: 2 , Page(s): 2189 -2191 vol.2 |
|
CNF |
An on-chip ESD protection circuit
with complementary SCR structures for submicron CMOS
ICs Ming-Dou Ker; Chung-Yu Wu; Hsin-Chin Jiang; Chung-Yuan Lee; Ko, J.; Hsue, P.; Bayoumi, M.A.; Jenkins, W.K. Circuits and Systems, 1994., Proceedings of the 37th Midwest Symposium on Volume: 2 , Page(s): 1145 -1148 vol.2 |
|
CNF |
High performance bulk MOSFET
fabricated on SOI substrate for ESD protection and circuit
applications Mansun Chan; King, J.C.; Ko, P.K.; Chenming Hu SOI Conference, 1994 Proceedings., 1994 IEEE International , Page(s): 61 -62 |