Cover Page
(PDF Format)
Books / Chapters in Books / Test Standard
https://doi.org/10.1007/978-1-4614-6623-9_6-1.
| No. |
Cover Page (PDF Format)
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Books / Chapters in Books / Test Standard |
| 1 |
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Ming-Dou Ker and Cheng-Hsiang Cheng,
“Closed-Loop Neuromodulation System-on-Chip (SoC) for Detection and
Treatment of Epilepsy,” a Chapter in Handbook of Biochips: Integrated
Circuits and Systems for Biology and Medicine, Springer, New York,
Aug. 2021, pp. 1-30. (Online ISBN978-1-4614-6623-9) https://doi.org/10.1007/978-1-4614-6623-9_6-1. |
| 2 |
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Ming-Dou Ker, and C.-T. Yeh, Chapter 5, “Design of Power-Rail ESD Clamp Circuits with Gate-Leakage Consideration in Nanoscale CMOS Technology,” Electrostatic Discharge Protection: Advances and Applications, CRC Press, Sept., 2015, pp. 67-86. (ISBN:9781482255881 - CAT# k24034) |
| 3 |
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Ming-Dou Ker, C.-Y. Lin, and Y.-W. Hsiao, Chapter 4, “ESD Protection Designs with Low-Capacitance Consideration for Radio Frequency Integrated Circuits,” Electrostatics: Theory and Applications, Nova Science Publishers, 2010, pp. 125-158. (ISBN: 978-1-61668-549-2) |
| 4 |
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Ming-Dou Ker and Sheng-Fu Hsu, Transient-Induced Latchup in CMOS Integrated Circuits, John Wiley & Sons, 2009. (ISBN: 978-0-470-82407-8) |
| 5 |
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柯明道、蕭淵文, 積體電路之電路板層級元件充電模式靜電放電測試標準 (Test Standard for Board-Level Charged-Device Model Electrostatic Discharge Robustness of Integrated Circuits), 2007. |
| 6 |
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許炳堅、吳重雨、柯明道, 追求21世紀的金鑰匙, 國立交通大學出版社, 2007. (ISBN: 9789868299740) |
| 7 |
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Ming-Dou Ker, Chapter 7, “ESD Protection Design in Nano CMOS,” Advanced Signal Processing, Circuits, and System Design Techniques for Communications, IEEE Press, 2006, pp. 217-279. (ISBN: 1-4244-0460-6) |
| 8 |
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Ming-Dou Ker, Chapter 5, “Electrostatic Discharge Protection Design,” Nano-CMOS Circuit and Physical Design, John Wiley & Sons, 2005, pp. 172-219. (ISBN: 0-471-46610-7) |