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[Invited_Talks_and_Courses]  [US_Patents]  [Taiwan_Patents]  [China_Patents]  [Book_Chapters]

[1]

Chun-Yu Lin, “Low-C ESD Protection Design in CMOS Technology,” Electrical Discharge, IntechOpen, 2019. (DOI: 10.5772/intechopen.85594)

[2]

M.-D. Ker, Chun-Yu Lin, and Y.-W. Hsiao, Chapter 4, “ESD Protection Designs with Low-Capacitance Consideration for Radio Frequency Integrated Circuits,” Electrostatics: Theory and Applications, Nova Science Publishers, 2011, pp. 125-158. (ISBN: 978-1-61668-549-2)