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[Referred_Journal_Papers] [International_Conference_Papers] [Local_Journal_and_Conference_Papers] [Invited_Talks_and_Courses] [US_Patents] [Taiwan_Patents] [China_Patents] [Book_Chapters]
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[1] |
柯杰辰、林群祐、柯明道、江宗殷、王俊淇、姜信欽, “共同封裝瞬態電壓抑制器(TVS)以應用於氮化鎵(GaN)功率高電子遷移率電晶體之靜電放電防護 ,” Taiwan ESD and Reliability Conference, 2025. (榮獲最佳論文獎) |
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[2] |
陳冠穎、吳士昕、陳柏孝、林群祐, “應用於混合電壓系統的雙偵測節能型2×VDD ESD防護電路設計,” Taiwan ESD and Reliability Conference, 2025. |
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[3] |
李皓元、鄭皓恩、林群祐, “應用於射頻ESD保護之高面積效率SCR設計,” Taiwan ESD and Reliability Conference, 2025. |
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[4] |
H.-E. Cheng, and Chun-Yu Lin, “An area-efficient SCR design for RF ESD protection,” VLSI Design/CAD Symposium, 2025. |
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[5] |
S.-H. Wu, P.-X. Chen, and Chun-Yu Lin, “Energy-efficient 2xVDD-tolerant ESD clamp circuit with dual detection for mixed-voltage systems ,” VLSI Design/CAD Symposium, 2025. |
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[6] |
S.-H. Wu, P.-X. Chen, and Chun-Yu Lin, “Ultra-low leakage current power-rail ESD clamp circuit against false trigger during fast power-on events,” Taiwan ESD and Reliability Conference, 2024. |
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[7] |
H.-E. Cheng, C.-L. Wu, and Chun-Yu Lin, “Design of 3×VDD-tolerant power-rail ESD clamp circuit for negative voltage application,” Taiwan ESD and Reliability Conference, 2024. |
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[8] |
S.-H. Wu, P.-X. Chen, and Chun-Yu Lin, “ESD protection circuit with dual detection mechanism,” VLSI Design/CAD Symposium, 2024. |
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[9] |
H.-E. Cheng, C.-L. Wu, and Chun-Yu Lin, “ESD protection design for the power pin in a negative voltage environment,” VLSI Design/CAD Symposium, 2024. |
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[10] |
L.-Y. Chiu and Chun-Yu Lin, “ESD protection design of RF circuits for communication systems,” 全國電信研討會, 2024. (榮獲最佳論文獎) |
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[11] |
侯洋守、林群祐, “靜電放電對積體電路金屬電遷移現象之研究,” Taiwan ESD and Reliability Conference, 2023. |
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[12] |
王宣賀、林群祐, “應用於雙電源電路電源間之靜電放電防護設計,” Taiwan ESD and Reliability Conference, 2023. |
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[13] |
Y.-S. Hou and Chun-Yu Lin, “Characterization of ESD-induced electromigration on metal lines in on-chip ESD protection circuit,” VLSI Design/CAD Symposium, 2023. |
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[14] |
X.-H. Wang and Chun-Yu Lin, “ESD protection circuit design for multiple power domains,” VLSI Design/CAD Symposium, 2023. |
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[15] |
曾裕程、林健群、林群祐, “Impact of Humidity on Robustness of ESD Protection Circuit,” Taiwan ESD and Reliability Conference, 2022. (榮獲最佳學生論文獎) |
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[16] |
C.-Y. Liu, W.-C. Liao, and Chun-Yu Lin, “Impact of humidity on ESD robustness of integrated circuits and systems,” VLSI Design/CAD Symposium, 2022. |
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[17] |
T.-H. Yeh, Y.-Q. Fu, and Chun-Yu Lin, “RC-diode ESD protection design for RF and microwave applications,” Taiwan ESD and Reliability Conference, 2021. (榮獲最佳論文獎) |
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[18] |
林健群、傅義全、林群祐, “低壓CMOS製程之電源箝制靜電放電防護電路,” Taiwan ESD and Reliability Conference, 2021. |
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[19] |
王俊捷、戴子鈞、林群祐, “全P型電晶體之靜電放電防護設計,” Taiwan ESD and Reliability Conference, 2021. (榮獲最佳報告獎) |
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[20] |
戴子鈞、賴玉瑄、林群祐, “π型矽控整流器之研究,” Taiwan ESD and Reliability Conference, 2019. |
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[21] |
Bo-Wei Peng and Chun-Yu Lin, “應用於K/Ka-Bands之低損耗焊墊搭配靜電放電防護元件,” Taiwan ESD and Reliability Conference, 2019. (榮獲最佳論文獎) |
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[22] |
林群祐、賴玉瑄、戴子鈞、王泰瑞、鍾育華, “面板級封裝抗靜電電路之設計與開發,” Taiwan ESD and Reliability Conference, 2019. |
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[23] |
Chun-Yu Lin, Y.-H. Lai, and Z.-J. Dai, “Distributed diode-triggered SCR for broadband ESD protection in CMOS technology,” VLSI Design/CAD Symposium, 2019. |
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[24] |
傅義全、王日彥、林群祐, “多頻帶射頻晶片之靜電放電防護設計,” Taiwan ESD and Reliability Conference, 2018. |
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[25] |
C.-H. Yu, J.-Y. Wang, Y.-R. Chen, C.-Y. Chen, and Chun-Yu Lin, “Study of whole-chip ESD protection with dual resistor-triggered SCRs for X-band applications in CMOS technology,” Taiwan ESD and Reliability Conference, 2018. |
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[26] |
林群祐、邱彥璉、賴玉瑄, “應用於堆疊式輸出級驅動電路之靜電放電防護設計,” Taiwan ESD and Reliability Conference, 2017. (榮獲最佳論文獎) |
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[27] |
陳俊宇、王日彥、傅義全、林群祐, “電阻觸發型矽控整流器在靜電放電防護上的設計與應用,” Taiwan ESD and Reliability Conference, 2017. |
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[28] |
陳界廷、林群祐、柯明道, “應用於高速 I/O 介面之靜電放電防護設計,” Taiwan ESD and Reliability Conference, 2017. (榮獲最佳報告獎) |
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[29] |
李冠儀、林群祐, “應用在大訊號擺幅功率放大器的靜電放電防護元件,” Taiwan ESD and Reliability Conference, 2016. (榮獲最佳論文獎) |
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[30] |
陳界廷、林群祐、張榮堃、柯明道、曾子建、林自強, “應用於高速積體電路之靜電放電防護設計,” Taiwan ESD and Reliability Conference, 2016. |
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[31] |
W.-H. Fu and Chun-Yu Lin, “Study of BJT-based ESD protection design in BiCMOS technology,” VLSI Design/CAD Symposium, 2016. |
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[32] |
岳軒宇、邱鈺凱、林群祐, “多電源系統之元件充電模式靜電放電防護設計,” 電子,信號,與通訊創新科技研討會, 2016, p. 28. (榮獲優秀論文獎) |
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[33] |
張榮堃、林群祐, “應用於K/Ka頻段積體電路之靜電放電防護元件設計,” Taiwan ESD and Reliability Conference, 2015. (榮獲最佳論文獎) |
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[34] |
林群祐、范美蓮、柯明道, “內嵌矽控整流器之堆疊式二極體以增進CMOS積體電路之靜電放電耐受度,” Taiwan ESD and Reliability Conference, 2014. (榮獲最佳論文獎) |
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[35] |
Chun-Yu Lin, M.-L. Fan, and M.-D. Ker, “Whole-chip ESD protection design with SCR for RF applications in 65-nm CMOS process,” VLSI Design/CAD Symposium, 2014. |
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[36] |
C.-Y. Wu, H. Chiueh, T.-J. Chen, C.-L. Ho, C. Jeng, M.-D. Ker, Chun-Yu Lin, Y.-C. Huang, C.-W. Chou, T.-Y. Fan, M.-S. Cheng, Y.-L. Hsin, S.-F. Liang, Y.-L. Wang, F.-Z. Shaw, Y.-H. Huang, and W.-M. Chen, “A fully integrated 8-channel closed-loop neural-prosthetic CMOS SoC for real-time epileptic seizure control,” VLSI Design/CAD Symposium, 2014. |
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[37] |
Chun-Yu Lin, L.-W. Chu, S.-Y. Tsai, and M.-D. Ker, “ESD protection design for radio-frequency power amplifier in a 65-nm CMOS process,” Taiwan ESD and Reliability Conference, 2013. (榮獲最佳論文獎) |
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[38] |
Y.-C. Huang, Chun-Yu Lin, and M.-D. Ker, “On-chip negative high-voltage generator in low-voltage CMOS process for implantable medical applications,” Symposium on Engineering Medicine and Biology Applications, 2013. |
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[39] |
Chun-Yu Lin, L.-W. Chu, and M.-D. Ker, “ESD protection design for 60-GHz applications in a 65-nm CMOS process,” Taiwan ESD and Reliability Conference, 2012. (榮獲最佳論文獎) |
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[40] |
Chun-Yu Lin, L.-W. Chu, and M.-D. Ker, “SCR-based ESD protection design for V-band RF applications in a 65-nm CMOS process,” Electronic Technology Symposium, 2012. |
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[41] |
竹立煒、林群祐、蔡翔宇、柯明道、盧澤華、許村來、洪彬舫、宋明相、曾仁洲、張子恒、蔡銘憲, “以改良式電感電容共振腔實現之60-GHz射頻靜電放電防護電路,” Taiwan ESD and Reliability Conference, 2011, pp. 50-53. |
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[42] |
M.-D. Ker, Chun-Yu Lin, and T.-L. Chang, “CDM ESD robustness of 65-nm core circuits with coupling effects,” Taiwan ESD and Reliability Conference, 2011, pp. 63-64. |
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[43] |
M.-D. Ker, W.-L. Chen, Chun-Yu Lin, and Y.-J. Li, “Bi-phase stimulus driver with loading adaptability for epileptic seizure suppression,” Symposium on Engineering Medicine and Biology Applications, 2011. |
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[44] |
林群祐、柯明道, “55 奈米金氧半製程中利用初始導通技術實作之元件充電模式靜電放電防護設計,” Taiwan ESD and Reliability Conference, 2010, pp. 19-23. (榮獲最佳論文獎) |
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[45] |
L.-W. Chu, Chun-Yu Lin, M.-D. Ker, T.-H. Lu, P.-F. Hung, and H.-C. Li, “ESD protection design for 60-GHz RF ICs in nanoscale CMOS technology,” VLSI Design/CAD Symposium, 2010, pp. 458-461. |
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[46] |
Chun-Yu Lin and M.-D. Ker, “Design on low-and-constant capacitance with SCR devices for on-chip 5-GHz RF ESD protection,” Taiwan ESD Conference, 2009, pp. 53-56. (榮獲最佳論文獎) |
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[47] |
Y.-W. Hsiao, Chun-Yu Lin, and M.-D. Ker, “Design and realization of ultra low-capacitance bond pad with inductive compensation for RF circuits in CMOS technology,” VLSI Design/CAD Symposium, 2007, pp. 1-4. |
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(Local Journal Papers) |
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[1] |
林群祐、柯明道, “射頻功率放大器之靜電放電防護設計,” 電子月刊, 第20卷, 第4期, pp. 140-151, Apr. 2014. |
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[2] |
林群祐、柯明道, “60-GHz積體電路之靜電放電防護設計,” 電子月刊, 第19卷, 第6期, pp. 120-130, Jun. 2013. |
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[3] |
林群祐、柯明道, “元件充電模式之靜電放電防護設計,” 電子月刊, 第17卷, 第5期, pp. 154-164, May 2011. |
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[4] |
林群祐、柯明道, “積體電路產品之靜電放電測試及防護技術,” 中國工程師學會會刊, 第84卷, 第2期, pp. 62-70, Apr. 2011. |
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[5] |
林群祐、柯明道, “適用於射頻積體電路之極低寄生電容靜電放電防護設計,” 電子月刊, 第16卷, 第7期, pp. 164-174, Jul. 2010. |